IEEE Access, Robust Adversarial Attack Against Explainable Deep Classification Models Based on Adversarial Ima ges With Differ ent Patch Sizes and Perturbation Ratios.

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IEEE Access, Robust Adversarial Attack Against Explainable Deep Classification Models Based on Adversarial Ima ges With Differ ent Patch Sizes and Perturbation Ratios.

Kang, Hyoeun, and Howon Kim. "Robust Adversarial Attack Against Explainable Deep Classification Models Based on Adversarial Images With Different Patch Sizes and Perturbation Ratios." IEEE Access 9 (2021): 133049-133061.