Authors: Thi-Thu-Huong Le, Shinwook Heo, Howon Kim

Journal: IEEE Transaction on Smart Grids (SCI paper, top 5)

Abstract: Load identification is a core concept in non-intrusive load monitoring (NILM). Through NILM systems, users can check their home appliance usage habits and then adjust their behavior to save electricity. In this way, a NILM system offers an effective method to detect the event status of household appliances as well as individual loads' energy consumption. However, prior NILM methods have encountered a challenge in improving recognition accuracy for both linear load and non-linear load types. These methods used a representative feature, namely transient load signals. However, the transient signals on these loads differ in terms of transient time and transient shape, which is the main cause of reduced accuracy performance in load identification. To this end, this paper presents a novel method, HT-LSTM (Hilbert Transform Long Short-Term Memory), which enhances recognition of the various load types that contain the difference in the transient time and the transient shape of any load signal. The proposed method consists of two main parts: (i) generating a novel transient feature based on a Hilbert transform (HT), called APF (Amplitude-Phase-Frequency). APF features are sequential data, which is used for the classification model; and (ii) applying Sequence-to-Sequence Long Short-Term Memory (Seq2Seq LSTM) to identify appliances by using APF features as the input data. In this work, we evaluate the HT-LSTM method using two high-frequency public datasets, Building-Level fUlly-labeled dataset for Electricity Disaggregation (BLUED) and Plug Load Appliance Identification Dataset (PLAID). Also, we evaluate our method using a private dataset collected in the lab. Based on the experimental results obtained and comparison classification performance pointed, the proposed method outperforms previous methods of F-score measurement on both public datasets in load identification as well as the private dataset.

Link: https://ieeexplore.ieee.org/document/9380665